Semiconductor Failure Model Study. Addendum

Abstract

This report presents the results of a limited preliminary study to obtain methodology for failure modeling of transistors and diodes for use in electromagnetic pulse vulnerability studies on aerospace electronic systems. The report describes the methodology and presents data and analysis to document the model.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1976
Accession Number
ADB018635

Entities

People

  • Cletus C. Sutter

Organizations

  • Boeing

Tags

Communities of Interest

  • Advanced Electronics
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accumulators
  • Air Force
  • Air Force Facilities
  • Classification
  • Electromagnetic Pulses
  • Experimental Data
  • Laboratory Procedures
  • New Mexico
  • Security
  • Semiconductors
  • Test And Evaluation
  • Transistors
  • Vulnerability

Readers

  • Business Analytics
  • Computational Modeling and Simulation
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.

Technology Areas

  • Microelectronics
  • Space