Holographic Recording in Nano-Sized As2S3 Films

Abstract

The diffraction gratings in 10, 15 and 2Onm thick As2S3 films are holographically recorded with a totally reflected reference wave. The maximum measured values of the diffraction efficiency are 0.0005%, 0.004% and 0.007% respectively. The exposure dependence on the diffraction efficiency is investigated. Despite of the relatively low efficiency, we succeed in the focal plane quasi-Fourier USAF test target holographic recording and reconstructed.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2001
Accession Number
ADP011532

Entities

People

  • J. Dikova
  • S. Sainov
  • V. Sainov

Organizations

  • Bulgarian Academy of Sciences

Tags

DTIC Thesaurus Topics

  • Absorption Coefficients
  • Advanced Materials
  • Diffraction
  • Efficiency
  • Electron Diffraction
  • Electron Microscopes
  • Electrons
  • Evanescent Waves
  • Films
  • Focal Planes
  • Holograms
  • Optical Materials
  • Plane Waves
  • Refractive Index
  • Thick Films
  • Total Internal Reflection
  • Waves

Fields of Study

  • Physics

Readers

  • Military Leadership and Professional Education.
  • Optical Physics and Photonics.
  • Thin Film Deposition Science.