In-Situ Characterization of Ultra-Small Magnetic Junctions Made by Electrochemical Techniques

Abstract

Electrochemical impedance spectroscopy is used to characterize the growth of NiO over Ni electrodes. We find a limited increase of thickness and a significant increase of porosity of the oxide as a function of time and anodization potential. Conductance measurements performed on Ni/NiO/Co junctions of 30 nm diameters indicate the presence of a Coulomb blockade at low temperatures and small bias. Tunneling is observed at higher bias. Small magnetoresistance ratios (1%) are found.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 2001
Accession Number
ADP012278

Entities

People

  • Alexander S. Sokolov
  • B. Doudin
  • C. S. Yang
  • J. R. Jennings.
  • J. Redepenning

Organizations

  • University of Nebraska–Lincoln

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Capacitance
  • Chemistry
  • Dielectric Properties
  • Dielectrics
  • Electrical Properties
  • Films
  • Frequency
  • Impedance
  • Low Temperature
  • Magnetic Detectors
  • Magnetoresistance
  • Material Degradation Processes
  • Materials
  • Materials Processing
  • Materials Science
  • Oxide Films
  • Thin Films

Fields of Study

  • Physics

Readers

  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Thin Film Deposition Science.