Electrical-Electronic Equipment Test Set (EEETS)

Abstract

Design and develop the EEETS necessary for production/pre-launch checkout of MOD 7 wafer required for the ongoing test launch program. The program will replace the current unsupportable test set which consists of a non-standard processor, proprietary software, and requires Digital-to-Analog Converter (DAC) cards no longer made (no suitable substitute).

Document Details

Document Type
Accomplishment
Publication Date
Oct 01, 2013
Source ID
fe953422f720821389dd1eceb3f22f53

Tags

Fields of Study

  • Engineering

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Materials Science
  • Unmanned Aerial System (UAS) Autonomous Capabilities and Mission Reconnaissance.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems

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